Journal papers
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- 38 "Modeling and extraction technique for parasitic resistances in MOSFETs Combining DC I-V and low frequency C-V measurement" Solid-State Electron, , 2012-01
- 37 "Production of β-carotene and Acetate in Recombinant Escherichia coli with or without Mevalonate Pathway at Different Culture Temperature or pH" Biotechnol. Bioprocess Eng., vol. 17, issue 6, pp. 1196-1204, 2012-12
- 36 "Comparative investigation of endurance and bias temperature instability characteristics in metal-Al 2 O 3 -nitride-oxide-semiconductor (MANOS) and semiconductor-oxide-nitride-oxide-semiconductor (SONO" Journal of Semiconductor Technology and Science, vol. 12, no. 4, pp.449-457, 2012-12
- 35 "Avalanche Hot Source Method for Separated Extraction of Parasitic Source and Drain Resistance in Single Metal-Oxide-Semiconductor Field Effect Transistors" Journal of Semiconductor Technology and Science, vol. 12, no. 1, pp. 46-52, 2012-03
- 34 "Density of States-Based Design of Metal Oxide Thin-Film Transistors for High Mobility and Superior Photostability" ACS Appl. Mater. Interfaces, vol. 4, no. 10, pp. 5416-5421, 2012-09
- 33 "Complementary Silicon Nanowire Hydrogen Ion Sensor With High Sensitivity and Voltage Output" IEEE Electron Device Letters, vol. 33, no. 12, pp. 1768-1770, 2012-12
- 32 "Amorphous InGaZnO Thin-Film Transistors-Part II Modeling and Simulation of Negative Bias Illumination Stress-Induced Instability" IEEE Transactions on Electron Devices, vol. 59, no. 10, pp. 2699-2706, 2012-10
- 31 "Amorphous InGaZnO Thin-Film Transistors-Part I: Complete Extraction of Density of States Over the Full Subband-Gap Energy Range" IEEE Transactions on Electron Devices, vol. 59, no. 10, pp. 2689-2698, 2012-10
- 30 "Subbandgap Optical Differential Body-Factor Technique and Characterization of Interface States in SOI MOSFETs" IEEE Electron Device Letters, vol. 33, no. 7, pp. 922-924, 2012-07
- 29 "Instability of amorphous oxide semiconductors via carrier-mediated structural transition between disorder and peroxide state" Phys. Status Solid, vol 249, no. 6, pp. 1277-1281, 2012-02
- 28 "Extraction of the Channel Mobility in InGaZnO TFTs Using Multifrequency Capacitance-Voltage Method" IEEE Electron Device Letters, vol. 33, no. 6, pp. 815-817, 2012-06
- 27 "Comparative analysis of temperature thermally induced instability between Si–In–Zn–O and Ga–In–Zn–O thin film transistors" Thin-Solid Films vol. 520, vol. 520, no. 10, pp. 3796-3799, 2012-03
- 26 "Modified Conductance Method for Extraction of Subgap Density-of-States in a-IGZO Thin-Film Transistors" IEEE Electron Device Letters, vol. 33, no. 8, pp.. 1138-1140, 2012-08
- 25 "Simulation study on discrete charge effects of SiNW biosensors according to bound target position using a 3D TCAD simulator" IOP Science Nanotechnology, vol. 23, p. 065202, 2012-01
- 24 "Hybrid C-V and I-V Technique for Separate Extraction of Structure- and Bias-Dependent Parasitic Resistances in a-InGaZnO TFTs" IEEE Electron Device Letters, vol. 33, no 4, 2012-04
- 23 "Extraction of the sub-bandgap density-of-states in polymer thin-film transistor with the multi-frequency capacitance-voltage spectroscopy" Appl. Phys. Letters, vol. 100, issue. 13, p. 133506, 2012-03
- 22 "Differential Ideality Factor Technique for Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors" IEEE Electron Device Letters, vol.33, no. 3, pp. 339-401, 2012-03
- 21 "Vertical Gate Si/SiGe Double HBT-based Capacitorless 1T DRAM Cell for Extended Retention time at Low Latch Voltage" IEEE Electron Device Letters, vol.33, no. 2, pp. 134-136, 2012-02
- 20 "Impact of Oxygen Flow Rate on the Instability under Positive Bias-Stresses in DC Sputtered Amorphous InGaZnO Thin-Film Transistors" IEEE Electron Device Letters, vol. 33, no. 1,pp. 62-64, 2012-01
- 19 "Physical Parameter-Based SPICE Models for InGaZnO Thin Film Transistors Applicable to Process Optimization and Robust Circuit Design" IEEE Electron Device Letters, vol. 33, no. 1, pp. 59-61, 2012-01
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