26I. Nam, D. Kim, C.-W. Baik, D. M. Kim, S. Hwang, and S. Kim"Direct Determination of Parasitic Gate Capacitance with Compensated Displacement Current in Silicon Nanowire FETs"ISANN 2013, 2013-12
25T. S. Kim, H.-S. Kim, J. S. Park, K. S. Son, E. S. Kim, J.-B. Seon, S. Lee, S.-J. Seo, S.-J. Kim, S. Jun., K. M. Lee, D. J. Shin, J. Lee, C. Jo, S.-J. Choi, D. M. Kim, D. H. Kim, M. Ryu, S.-H. Cho and"High performance gallium-zinc oxynitride thin film transistors for next-generation display applications"IEDM Dig. Tech. Papers, 2013-12
24J. Jang, J. Lee, H. Kim, J. Lee, J. W. Chung, B. Lee, D. M. Kim, S.-J. Choi, D. H. Kim"Inkjet Printed Polymer SRAM-cell Design for Flexible FPGA with Physical Parameter-Based TFT Model"IEDM Dig. Tech. Papers, 2013-12
23J. Lee, S. Hwang, B. Choi, J. H. Lee, B.-G. Park, D.-I. Moon, M.-L. Seol, C.-H. Kim, Y.-K. Choi, D. M. Kim, D. H. Kim, S.-J. Choi"A Novel SiNW/CMOS Hybrid Biosensor for High Sensitivity/Low Noise"IEDM Dig. Tech. Papers, 2013-12
22J.-H. Bae, S. Hwang, J. Shin, H.-I. Kwon, C. H. Park, H. Choi, J.-B. Park, J. Kim, J. Ha, K. Park, J. Oh, J. Shin, U-I. Chung, K.-S. Seo, and J.-H. Lee"Analysis of DC/transient current and RTN behaviors related to traps in p-GaN gate HEMT"2013 International Electron Meeting (IEDM), 2013-12
21J. Lee, S. Hwang, B. Choi, S. Choi, J. H. Lee, B.-G. Park, D. M. Kim, S.-J. Choi and D. H. Kim"Noise-Immune Silicon Nanowire/CMOS Hybrid Biosensor Using Top-Down Approach"MicroTAS 2013, 2013-10
20G. Kim, E. Park, J. H. Kim, J.-H. Bae, D. H. Kang, and B.-G. Park"Trap analysis of InGaN-based blue light emitting diodes using current-transient methodology"2013 International Conference on Solid State Devices and Materials (SSDM), 2013-09
19J. Jang, J. Lee, H. Kim, S.-J. Choi, D. M. Kim, and D. H. Kim"Density-of-States Based Numerical and Analytical Models for Solution-Processed Polymer TFTs"ITC-CSCC 2013, p.357, 2013-07
18J. Lee, J. Jang, S.-J. Choi, D. M. Kim, and D. H. Kim"Top-Down Silicon Nanowire FETs for Biosensors"ITC-CSCC 2013, p.144, 2013-07
17D. H. Kim, K. M. Lee, S.-J. Choi, and D. M. Kim"Density-of-States Based Modeling of Oxide Thin-Film Transistors: Toward Instability-Aware Design"AWAD 2013, p.67, (Invited talk), 2013-06
16C. Jo, H. Bae, S. Jun, H. Choi, S. Hwang, D. H. Kim, and D. M. Kim"Characterization of Asymmetrical Negative Bias Stress Effect on the Density-of-States and Parasitic Resistances in a-IGZO Thin-Film Transistors"in SID'13 Dig. Tech. Papers, 2013-05
15J. Jang, J. Kim, J. Lee, C. Jo, S. Jun, H. Kim, S. Choi, D. M. Kim, J. Lee, B. Koo, J. W. Chung, and D. H. Kim"Density-of-States Based Device-Circuit Co-Design Platform for Solution-Processed Organic Integrated Circuits"in SID'13 Dig. Tech. Papers, 2013-05
14H. Bae, S. Jun, H. Choi, C. H. Jo Y. H. Kim, J. S. Hwang, J. Ahn, D. H. Kim, and D. M. Kim"Separate Extraction Technique of Intrinsic Donor- and Acceptor-like Density-of-States over Full-Energy Range Sub-bandgap in Amorphous Oxide Semiconductor Thin Film Transistors by Using One-Shot Monoch"in SID'13 Dig. Tech. Papers, 2013-05
13J. Lee, J. Jang, J. Kim, H. Kim, S. Choi, D. H. Kim, J. Lee, J. W. Chung, B. Koo, and D. M. Kim"Transfer Characteristic-Based Electro-Optical Technique for Characterization of Carrier Lifetimes with Associated Physical Mechanisms in Polymer-based Organic Thin-Film Transistors"in SID'13 Dig. Tech. Papers, 2013-05
12J. Kim, J. Jang, J. Lee, W. Kim, I. Hur, C. Jo, S. Jun, H. Kim, K. M. Lee, D. J. Shin, D. M. Kim, and D. H. Kim"Analytical Current Model for Polymer-based Thin Film Transistors Considering the Field-Dependent Mobility and Nonlinearity in the Linear Region"The 20th Korean Conference on Semiconductors, 2013-02
11H. Seo, H. Bae, C. Jo, E. Hong, H. Choi, J. S. Hwang, J. Ahn, D. H. Kim, and D. M. Kim"Characterization of Free Electron-Deembedded Subgab Density-of-States in a-IGZO TFTs from the Sub-Bandgap Optical Subthreshold Characteristics"The 20th Korean Conference on Semiconductors, 2013-02
10C. Jo, S. Jun, W. Kim, I. Hur, J. Jang, J. Kim, J. Lee, Y. H. Kim, H. Bae, D. J. Shin, K. M. Lee, H. Kim, D. H. Kim, and D. M. Kim"Characterization of Negative Bias Stress Instability Mechanisms in Amorphous InGaZnO Thin Film Transistors"The 20th Korean Conference on Semiconductors, 2013-02
9J. Jang, J. Kim, J. Lee, H. Kim, D. M. Kim, and D. H. Kim"Density-of-States (DOS)-based I-V and C-V Models and Link to Circuit Simulator for Polymer Thin Film Transistors (PTFTs)"The 20th Korean Conference on Semiconductors, 2013-02
8W. H. Lee, J.-M. Lee, M. Uhm, J. Lee, J. H. Lee, H. Bae, E. Hong, S. Hwang, Y. H. Kim, B. S. Choi, B.-G. Park, D. M. Kim, Y.-J. Jeong, and D. H. Kim"Characterization of Subthreshold Slope Degradation in CMOS-based Silicon Nanowire Biosensors"The 20th Korean Conference on Semiconductors, 2013-02
7J. Lee, J. H. Lee, M. Uhm, W. H. Lee, S. Hwang, B. S. Choi, B.-G. Park ,D. M. Kim, and D. H. Kim"Implementation and Characterization of Gate-Induced Drain Leakage Current-Based Multiplexed SiNW Biosensor"The 20th Korean Conference on Semiconductors, 2013-02